2011
K. DAOUD, K. BOUAMAMA, P. DJEMIA, SM. CHERIF, Ab initio calculation of the elastic properties and the lattice dynamics of
the AlAs
Sb
alloy under pressure High Pressure Research, 31(2), 310-324 (2011)
D. FAURIE, P.-O. RENAULT, E. LE BOURHIS, T. CHAUVEAU, O. CASTELNAU, Ph. GOUDEAU, X-ray strain analysis of 111 fiber-textured thin films independent of grain-interaction models, Journal of Applied Crystallography 44, 409-413 (2011)
E. LE BOURHIS, D. FAURIE, P.-O. RENAULT, G. GEANDIER, D. THIAUDIERE, O. CASTELNAU, Ph. GOUDEAU, X-ray elastic response of metallic thin film supported by polyimide substrates, Journal of strain analysis for engineering design 46, 639 (2011), Invited Paper in Special Issue : "Strain Measurement by Synchrotron X-Rays"
P DJEMIA, A FILLON, G ABADIAS, A MICHEL, C JAOUEN, Elastic properties of metastable MoSi alloy thin films : A Brillouin light scattering study, Surface and Coatings Technology , 206(7),pp. 1824-1829 (2011)
D. FAURIE, P.-O. RENAULT, G. GEANDIER, E. LE BOURHIS
Time resolved synchrotron x-ray strain measurements of gold thin film on flexible substrate, Thin Solid Films, in press, doi:10.1016/j.tsf.2011.07.059, (2011).
P.-O. RENAULT, S. DJAZIRI, E. LE BOURHIS, PH. GOUDEAU, D. FAURIE, D. THIAUDIERE, F. HILD. Measurement of applied strains in thin films deposited onto polymer by synchrotron X-ray diffraction. Procedia Engineering 10, 2701-2706, (2011).
S. DJAZIRI, P.-O. RENAULT, F. HILD, E. LE BOURHIS, P. GOUDEAU, D. THIAUDIÈRE, D. FAURIE. Combined synchrotron X-ray and image-correlation analyses of biaxially deformed W/Cu nanocomposite thin films on Kapton. Journal of Applied Crystallography 44, 1071-1079 (2011).
2010
G. GEANDIER, P.-O. RENAULT, E. LE BOURHIS, PH. GOUDEAU, D. FAURIE, C. LE BOURLOT, PH. DJÉMIA, O. CASTELNAU, S. M. CHÉRIF, Elastic-strain distribution in metallic film-polymer substrate composites, Applied Physics Letters 96, 041905 (2010)
(Sélectionné pour le Virtual Journal of Nanoscale Science & Technology, issue 6, volume 21, February 8, 2010)
E. LE BOURHIS, B. GIRAULT, P.-O. RENAULT, P. GOUDEAU, G. GEANDIER, D. THIAUDIÈRE, R.N. RANDRIAMAZAORO, R. CHIRON, D. FAURIE, O. CASTELNAU, Development of a biaxial tensile module at Synchrotron beamline for the study of mechanical properties of nanostructured films, Materials Research Society Symposium Proceeding 1224, GG03-08 (2010)
D. FAURIE, P. DJEMIA, E. LE BOURHIS, P.-O. RENAULT, Y. ROUSSIGNE, S. M. CHERIF, R. BRENNER, O. CASTELNAU, R. BRENNER, G. PATRIARCHE, P. GOUDEAU, Elastic anisotropy of polycrystalline Au films : modeling and respective contributions of X-ray diffraction, nanoindentation and Brillouin light scattering, Acta Materialia 58, 4998-5008 (2010)
M. GUENNOU, H. DAMMAK, P. DJEMIA, P. MOCH, PHAM-THI MAI, Electromechanical properties of single domain PZN 12%PT measured by three different methods, Solid State Sciences 12 (3), pp. 298-301 (2010)
G. GEANDIER, D. FAURIE, P.-O. RENAULT, C. LE BOURLOT, P. DJEMIA, O. CASTELNAU, S. M. CHERIF, E. LE BOURHIS, Ph. GOUDEAU, X-ray strain analysis in thin films enhanced by 2D detection, European Physical Journal : Web of Conferences 6, 26008 (2010)
S. DJAZIRI, D. THIAUDIERE, G. GEANDIER, P.-O RENAULT, E. LE BOURHIS, Ph. GOUDEAU, R. N. RANDRIAMZAORO, R. CHIRON, O. CASTELNAU, D. FAURIE, F. HILD, Mechanical characterization of nanostructured thin films at different scales, European Physical Journal : Web of Conferences 6, 26003 (2010)
S. DJAZIRI, D. THIAUDIERE, G. GEANDIER, P.-O RENAULT, E. LE BOURHIS, Ph. GOUDEAU, O. CASTELNAU, D. FAURIE, Controlled biaxial deformation of nanostructured W/Cu thin films studied by X-ray diffraction, Surface and Coatings Technology 105, 1420-1425 (2010)
G. GEANDIER, D. THIAUDIERE, R.N. RANDRIAMAZAORO, R. CHIRON, S. DJAZIRI, B. LAMONGIE, Y. DIOT, P.-O. RENAULT, Ph. GOUDEAU, A. BOUAFFAD, O. CASTELNAU, D. FAURIE, F. HILD, Development of a synchrotron biaxial tensile device for in-situ characterization of thin films mechanical response, Review of Scientific Instruments 81, 103903 (2010)
C. CIBERT, P. DUTHEIL, C. CHAMPEAUX, O. MASSON, G. TROLLIARD, F. TETARD, A. CATHERINOT, Piezoelectric characteristic of nanocrystalline AlN films obtained by pulsed laser deposition at room temperature,
Applied Physics Letters 97, 251906 (2010)
2009
P. DJEMIA.
La diffusion Brillouin pour caractériser les propriétés élastiques ou magnétiques de multicouches.
Instrumentation, Mesure, Métrologie (Hermès Science publications), « Les ondes en instrumentation », pp. 11-35 (2009).
D. FAURIE, O. CASTELNAU, R. BRENNER, P.-O. RENAULT, E. LE BOURHIS, PH.GOUDEAU, In situ diffraction strain analysis of elastically deformed polycrystalline thin films, and micromechanical interpretation, Journal of Applied Crystallography 42, (2009)
KH. BOUAMAMA, P. DJEMIA, K. DAOUD, S. M. CHERIF, Ab-initio calculation of the elastic properties and the lattice dynamics of the AgBr
Cl alloy, Computational Materials Science 47 pp. 308–313 (2009)
2007
K. BOUAMAMA, P. DJEMIA, N. LEBGA , K. KASSALI, Ab-initio calculation of the lattice dynamics of the Boron group-V compounds under high pressure. High Pressure Research, 7(2), 1-9 (2007)
K. BOUAMAMA, P. DJEMIA, Theoretical investigation of the elastic properties and lattice dynamics of the MgSSe alloy. Modern Physics Letters B. 21(4), 1-11 (2007)
P. DJEMIA, F. TÉTARD, K. BOUAMAMA, E. CHARRON, Y. RABINOVITCH. D. TETARD, Elasticity and lattice vibrational properties of yttrium-aluminum garnet : experiments and pair potential calculations, Journal of European Ceramics Society 27/16, pp 4719-4725 (2007)
P. DJEMIA, A. TALLAIRE, J. ACHARD , F. SILVA, A. GICQUEL. Elastic properties of single crystal diamond made by CVD. Diamond. Related. Materials 16 (4-7), pp 962-965 (2007)
D. FAURIE, P. DJEMIA, P.-O. RENAULT, Y. ROUSSIGNE, S.M. CHERIF, E. LE BOURHIS, Ph. GOUDEAU, Study of texture effect on elastic properties of Au thin films by x-ray diffraction and Brillouin light scattering, Journal of Physics : Conference Series 92, 012170 (2007)
E. LE BOURHIS, D. FAURIE, B. GIRAULT, P. GOUDEAU, P. –O. RENAULT, P. VILLAIN, F. BADAWI, Mechanical properties of thin films and nanometric multilayers using tensile testing and synchrotron x-ray diffraction, Plasma Processes and Polymers 4, 311 (2007)