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The LSPM Microscopy Service has acquired a new Scanning Electron Microscope (SEM) at a cost of 400 k€ fully funded by the laboratory. This is a Zeiss Crossbeam 350 FEG-SEM, a modular system that can be upgraded to a Focused Ion Beam (FIB) microscope with the addition of an ion column. The new device is now operational and installed in Room 006 of the L2 building.
